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researcher

S. Ilango

8 papers hereh-index 13755 citations46 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • middle author7

Across the 7 of 8 papers where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci8
same name
  • S. Ilango — 1 paper, h 4

Either other researchers who publish under this name, or the same person where the external sources have not merged their records.

identity via Semantic Scholar / OpenAlex

activity
20142019
most citedA comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures

179 citations · 259 across the 8 of their papers we have counts for

collaborators
Showing 2015Show all

2 papers · 1 filter

cond-mat.mtrl-sci2015★ 5 cited

XPS studies on AlN thin films grown by ion beam sputtering in reactive assistance of N+/N2+ ions: Substrate temperature induced compositional variations

Neha Sharma, S. Ilango, S. Dash +1

We report on an XPS study of AlN thin films grown on Si(100) substrates by ion beam sputter deposition (IBSD) in reactive assistance of N+/N2+ ions to unravel the compositional var…

cond-mat.mtrl-sci2015★ 5 cited

Optical band gap and associated band-tails in nanocrystalline AlN thin films grown by reactive IBSD at different substrate temperatures

Neha Sharma, Shilpam Sharma, K. Prabakar +4

AlN thin films have been grown on Si (100) substrates by reactive ion beam sputter deposition (IBSD) at different substrate temperatures varying from room temperature (RT) to 500oC…

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