activity
20142019
most citedA comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures

179 citations · 259 across the 8 of their papers we have counts for

collaborators

8 papers

cond-mat.mtrl-sci2019★ 13 cited

Crystallization kinetics and role of stress in Al induced layer exchange crystallization process of amorphous SiGe thin film on glass

Twisha Sain, Ch. Kishan Singh, S. Ilango +1

The present study reports Al induced crystallization (AIC) of amorphous (a)-SiGe in Al-Ge-Si ternary system at low temperature ~ 350 degree C. In addition to crystallization, the i…

cond-mat.mtrl-sci2019★ 16 cited

Si and N - vacancy color centers in discrete diamond nanoparticles: Raman and fluorescence spectroscopic studies

K. Ganesan, P. K. Ajikumar, S. Ilango +2

The present study reports on an innovative method to prepare discrete diamond nanoparticles or nanodiamonds (NDs) with high structural and optical quality through top-down approach…

cond-mat.mtrl-sci2017

In-situ formation of SiGe alloy by electron beam evaporation and the effect of post deposition annealing on the energy band gap

Twisha Tah, Ch. Kishan Singh, S. Amirthapandian +5

We report the synthesis of polycrystalline (poly)-SiGe alloy thin films through solid state reaction of Si/Ge multilayer thin films on Si and glass substrates at low temperature of…

cond-mat.mtrl-sci2017★ 26 cited

Flipping growth orientation of nanographitic structures by plasma enhanced chemical vapor deposition

Subrata Ghosh, K. Ganesan, S. R. Polaki +5

Nanographitic structures (NGSs) with multitude of morphological features are grown on SiO2/Si substrates by electron cyclotron resonance - plasma enhanced chemical vapor deposition…

cond-mat.mtrl-sci2016★ 179 cited

A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures

K. Ganesan, Subrata Ghosh, Nanda Gopala Krishna +3

Defects in planar and vertically oriented nanographitic structures (NGSs) synthesized by plasma enhanced chemical vapor deposition (PECVD) has been investigated using Raman and X-r…

cond-mat.mtrl-sci2015★ 5 cited

XPS studies on AlN thin films grown by ion beam sputtering in reactive assistance of N+/N2+ ions: Substrate temperature induced compositional variations

Neha Sharma, S. Ilango, S. Dash +1

We report on an XPS study of AlN thin films grown on Si(100) substrates by ion beam sputter deposition (IBSD) in reactive assistance of N+/N2+ ions to unravel the compositional var…