activity
20142019
most citedA comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures

179 citations · 259 across the 8 of their papers we have counts for

collaborators
Showing 2014 · cond-mat.mtrl-sciShow all

1 paper · 2 filters

cond-mat.mtrl-sci2014★ 15 cited

Growth Kinetic studies of ion beam sputtered AlN-thin films: Effect of reactive assistance of nitrogen plasma

Neha Sharma, K. Prabhakar, S. Ilango +2

Reactive dual ion beam sputter deposition of AlN thin films was carried out for the analysis of surface growth characteristics by Atomic Force Microscopy. The variation of roughnes…