24 citations · 46 across the 7 of their papers we have counts for
3 papers · 1 filter
Observation of hidden parts of dislocation loops in thin Pb films by means of scanning tunneling spectroscopy
A. Yu. Aladyshkin, A. S. Aladyshkina, S. I. Bozhko
Local electronic properties of quasi-two-dimensional Pb(111) islands with screw dislocations of different types on their surfaces were experimentally studied by means of low-temper…
Double Fe-impurity charge state in the topological insulator BiSe
V. S. Stolyarov, S. V. Remizov, D. S. Shapiro +10
The influence of individual impurities of Fe on the electronic properties of topological insulator BiSe is studied by Scanning Tunneling Microscopy. The microscope tip is u…
Fabrication of sharp atomic force microscope probes using in-situ local electric field induced deposition under ambient conditions
Alexei Temiryazev, Sergey I. Bozhko, A. Edward Robinson +1
We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope, or to repair a damaged probe. The method is based o…