141 citations · 1.2k across the 38 of their papers we have counts for
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Fast Fitting of Reflectivity Data of Growing Thin Films Using Neural Networks
Alessandro Greco, Vladimir Starostin, Christos Karapanagiotis +6
X-ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films. In this study, we show how a simple a…
Angular x-ray cross-correlation analysis (AXCCA): Basic concepts and recent applications to soft matter and nanomaterials
Ivan A. Zaluzhnyy, Ruslan P. Kurta, Marcus Scheele +3
Angular x-ray cross-correlation analysis (AXCCA) is a technique which allows quantitative measurement of the angular anisotropy of x-ray diffraction patterns and provides insights…
Revealing Grain Boundaries and Defect Formation in Nanocrystal Superlattices by Nanodiffraction
Nastasia Mukharamova, Dmitry Lapkin, Ivan A. Zaluzhnyy +8
X-ray nanodiffraction is applied to study the formation and correlation of domain boundaries in mesocrystalline superlattices of PbS nanocrystals with face-centered cubic structure…
Dye-Sensitized Ternary Copper Chalcogenide Nanocrystals: Optoelectronic Properties, Air Stability and Photosensitivity
Sonam Maiti, Santanu Maiti, Ali Hossain Khan +5
We report on the effect of ligand exchange of copper sulphide selenide as well as copper selenide nanocrystals with the organic pi-system Cobalt beta-tetraaminophthalocyanine and a…