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Comparative study of the growth of sputtered aluminum oxide films on organic and inorganic substrates
Stefan Sellner, Alexander Gerlach, Stefan Kowarik +5
We present a comparative study of the growth of the technologically highly relevant gate dielectric and encapsulation material aluminum oxide in inorganic and also organic heterost…
Optical Properties of Pentacene and Perfluoropentacene Thin Films
Alexander Hinderhofer, Ute Heinemeyer, Alexander Gerlach +5
The optical properties of pentacene (PEN) and perfluoropentacene(PFP) thin films on various SiO2 substrates were studied using variable angle spectroscopic ellipsometry. Structural…
Real-time observation of oxidation and photo-oxidation of rubrene thin films by spectroscopic ellipsometry
M. Kytka, A. Gerlach, J. Kovac +1
We follow in real-time and under controlled conditions the oxidation of the organic semiconductor rubrene grown on SiO_2 using spectroscopic ellipsometry. We derive the complex die…