60 citations · 88 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2007★ 60 cited
Nanometer-Scale Materials Contrast Imaging with a Near-Field Microwave Microscope
Atif Imtiaz, Steven M. Anlage, John D. Barry +1
We report topography-free materials contrast imaging on a nano-fabricated Boron-doped Silicon sample measured with a Near-field Scanning Microwave Microscope over a broad frequency…
cond-mat.mtrl-sci2004★ 28 cited
Near-Field Microwave Microscopy on nanometer length scales
Atif Imtiaz, Marc Pollak, Steven M Anlage +2
The Near-Field Microwave Microscope (NSMM) can be used to measure ohmic losses of metallic thin films. We report on the presence of a new length scale in the probe-to- sample inter…