On Delay Faults Affecting I/O Blocks of an SRAM-Based FPGA Due to Ionizing Radiations

Fatima Zahra Tazi, Claude Thibeault, Yvon Savaria +2

Experimental means to characterize delay faults induced by bit flips and SEUs in I/O blocks of SRAM-based FPGAs are proposed. A delay fault up to 6.2ns sensitized by an events chai…