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cond-mat.mtrl-sci2026

Interface-Controlled Defect Engineering in TiN/TaN Superlattices for Enhanced Hardness and Fracture Toughness

Zecui Gaoa, Qimin Wang, Julian Buchinger +6

TiNTaN superlattice coatings were designed to investigate how atomic-scale interface chemistry and defect-stabilized TaN layers govern hardness and fracture toughness. Guided by fi…

cond-mat.mtrl-sci2026

Quantitative Analysis of Composition and Contamination of Atomically Thin Materials by Recoil-Projectile Coincidence in Ion Transmission

Carolin Frank, Kevin Vomschee, Tuan Thien Tran +6

Surface contamination strongly affects the intrinsic properties of nanoscale materials, making its reliable identification and quantification crucial for both accurate experimental…

cond-mat.mtrl-sci2026

Rainbow Scattering from Graphene

Carolin Frank, Kevin Vomschee, Radek Holeňák +3

We report the experimental observation of atomic rainbow scattering of 40 keV Xe ions transmitted through self-supporting single-layer graphene using time-of-flight medium ener…

cond-mat.mtrl-sci2026

Impact of O concentration on the thermal stability and decomposition mechanism of (Cr,Al)N compared to (Ti,Al)N thin films

Pauline Kümmerl, Ganesh Kumar Nayak, Felix Leinenbach +6

The composition-dependent thermal stability of (CrAl)(ON) thin films with O concentrations of y = 0, 0.15, and 0.40…

cond-mat.mtrl-sci2025

Probing formation and epitaxy of ultrathin Titanium Silicide using low and medium energy ion scattering

Philipp M. Wolf, Eduardo Pitthan, Zhen Zhang +3

Titanium silicide is a key contact material in advanced three-dimensional semiconductor device architectures. Here, we examine the formation of ultrathin Ti-silicide on Si(100) usi…

cond-mat.mtrl-sci2025

Kinetics of the photochromic effect in oxygen-containing rare-earth hydrides

Dmitrii Moldarev, Tuan T. Tran, Max Wolff +1

The kinetics of the photochromic reaction of oxygen-containing rare-earth hydrides is commonly described by an exponential function assuming a single-step process. In this paper, w…