1.3k citations · 3.2k across the 7 of their papers we have counts for
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cond-mat.mes-hall2003★ 651 cited
Electron-Phonon Scattering in Metallic Single-Walled Carbon Nanotubes
Ji-Yong Park, Sami Rosenblatt, Yuval Yaish +6
Electron scattering rates in metallic single-walled carbon nanotubes are studied using an atomic force microscope as an electrical probe. From the scaling of the resistance of the…
cond-mat.mes-hall2003★ 158 cited
Electrical Nanoprobing of Semiconducting Carbon Nanotubes using an Atomic Force Microscope
Y. Yaish, J. -Y. Park, S. Rosenblatt +3
We use an Atomic Force Microscope (AFM) tip to locally probe the electronic properties of semiconducting carbon nanotube transistors. A gold-coated AFM tip serves as a voltage or c…