46 citations · 212 across the 10 of their papers we have counts for
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cond-mat.mtrl-sci2016★ 30 cited
Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy
E. Vittone, Z. Pastuovic, P. Olivero +5
The acronym IBIC (Ion Beam Induced Charge) was coined in early 1990's to indicate a scanning microscopy technique which uses MeV ion beams as probes to image the basic electronic p…
cond-mat.mtrl-sci2016★ 41 cited
Direct fabrication of three-dimensional buried conductive channels in single crystal diamond with ion microbeam induced graphitization
P. Olivero, G. Amato, F. Bellotti +10
We report on a novel method for the fabrication of three-dimensional buried graphitic micropaths in single crystal diamond with the employment of focused MeV ions. The use of impla…