125 citations · 305 across the 16 of their papers we have counts for
16 papers
The development of IBIC microscopy at the 100 kV ion implanter of the University of Torino (LIUTo) and the application for the assessment of the radiation hardness of a silicon photodiode
Emilio Corte, Alberto Bortone, Elena Nieto Hernández +6
The Ion Beam Induced Charge (IBIC) technique is widely used to characterize the electronic properties of semiconductor materials and devices. Its main advantage over other charge c…
IBIC analysis of a linear position sensitive detector: model and experiment
Ettore Vittone, Georgios Provatas, Karla Ivanković Nizić +1
The ion beam-induced charge (IBIC) analysis of a commercial silicon photodiode configured as a Position Sensitive Detector (PSD) for energetic charged particles is the subject of t…
Mechanisms of surface nanostructuring of Al2O3 and MgO by grazing incidence irradiation with swift heavy ions
Marko Karlusic, Ruslan A. Rymzhanov, Jacques H. O'Connell +10
We experimentally discovered that Al2O3 and MgO exhibit well-pronounced nanometric modifications on the surfaces when irradiated under grazing incidence with 23 MeV I beam, in cont…
Single-photon-emitting optical centers in diamond fabricated upon Sn implantation
S. Ditalia Tchernij, T. Herzig, J. Forneris +11
The fabrication of luminescent defects in single-crystal diamond upon Sn implantation and annealing is reported. The relevant spectral features of the optical centers (emission pea…
Monitoring ion track formation using in situ RBS/c and ERDA
Marko Karlusic, Stjepko Fazinic, Zdravko Siketic +4
The aim of this work is to investigate feasibility of the ion beam analysis techniques for monitoring swift heavy ion track formation. First, use of the in situ Rutherford backscat…
Formation of buried conductive micro-channels in single crystal diamond with MeV C and He implantation
F. Picollo, P. Olivero, F. Bellotti +6
As demonstrated in previous works, implantation with a MeV ion microbeam through masks with graded thickness allows the formation of conductive micro-channels in diamond which are…
Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy
E. Vittone, Z. Pastuovic, P. Olivero +5
The acronym IBIC (Ion Beam Induced Charge) was coined in early 1990's to indicate a scanning microscopy technique which uses MeV ion beams as probes to image the basic electronic p…
Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottky diode
P. Olivero, J. Forneris, P. Gamarra +6
The transport properties of a 4H-SiC Schottky diode have been investigated by the Ion Beam Induced Charge (IBIC) technique in lateral geometry through the analysis of the charge co…
Charge collection efficiency mapping of interdigitated 4H-SiC detectors
E. Vittone, N. Skukan, Z. Pastuovic +2
The Ion Beam Induced Charge Collection (IBIC) technique was used to map the charge collection efficiency (CCE) of a 4H-SiC photodetector with coplanar interdigitated Schottky barri…
Focused ion beam fabrication and IBIC characterization of a diamond detector with buried electrodes
P. Olivero, J. Forneris, M. Jaksic +4
This paper reports on the fabrication and characterization of a high purity monocrystalline diamond detector with buried electrodes realized by the selective damage induced by a fo…
On the threshold of ion track formation in CaF2
Marko Karlusic, Corneliu Ghica, Raluca Florentina Negrea +4
There is ongoing debate regarding the mechanism of swift heavy ion track formation in CaF2. The objective of this study is to shed light on this important topic using a range of co…
Creation and characterization of He-related color centers in diamond
Jacopo Forneris, Andrea Tengattini, Sviatoslav Ditalia Tchernij +11
Diamond is a promising material for the development of emerging applications in quantum optics, quantum information and quantum sensing. The fabrication and characterization of nov…
Electroluminescence from nitrogen-vacancy and interstitial-related centers in bulk diamond stimulated by ion-beam-fabricated sub-superficial graphitic micro-electrodes
J. Forneris, S. Ditalia Tchernij, A. Battiato +12
We report on the fabrication and characterization of a single-crystal diamond device for the electrical stimula- tion of light emission from nitrogen-vacancy (NV0) and other defect…
Electrical stimulation of single-photon emission from nitrogen-vacancy centers in diamond with sub-superficial graphitic electrodes
J. Forneris, D. Gatto Monticone, P. Traina +11
Focused MeV ion beams with micrometric resolution are suitable tools for the direct writing of conductive graphitic channels buried in an insulating diamond bulk. Their effectivene…
Measurement and modelling of anomalous polarity pulses in a multi-electrode diamond detector
J. Forneris, V. Grilj, M. Jaksic +6
In multi-electrode detectors, the motion of excess carriers generated by ionizing radiation induces charge pulses at the electrodes, whose intensities and polarities depend on the…
Energy threshold for nanodot creation by swift heavy ions
Marko Karlusic, Sevilay Akcoeltekin, Orkhan Osmani +4
We present theoretical and experimental data on the threshold behaviour of nanodot creation with swift heavy ions. A model calculation based on a two-temperature model taking the s…