153 citations · 624 across the 21 of their papers we have counts for
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cond-mat.mes-hall2024★ 1 cited
Towards Utilizing Scanning Gate Microscopy as a High-Resolution Probe of Valley Splitting in Si/SiGe Heterostructures
Efe Cakar, H. Ekmel Ercan, Gordian Fuchs +4
A detailed understanding of the material properties that affect the splitting between the two low-lying valley states in Si/SiGe heterostructures will be increasingly important as…
cond-mat.mes-hall2024★ 1 cited
Proposed real-time charge noise measurement via valley state reflectometry
David W. Kanaar, H. Ekmel Ercan, Mark F. Gyure +1
We theoretically propose a method to perform in situ measurements of charge noise during logical operations in silicon quantum dot spin qubits. Our method does not require ancillar…