49 citations · 83 across the 5 of their papers we have counts for
5 papers
Current Saturation in Nonmetallic Field Emitters
Stanislav S. Baturin, Alexander V. Zinovev, Sergey V. Baryshev
It has been known for a long time that traditional semiconductor (e.g. intrinsic and doped Si and Ge or binary SiC and GaN) field emitters significantly deviate from Fowler-Nordhei…
A Brief Technical History of the Large-Area Picosecond Photodetector (LAPPD) Collaboration
Bernhard W. Adams, Klaus Attenkofer, Mircea Bogdan +38
The Large Area Picosecond PhotoDetector (LAPPD) Collaboration was formed in 2009 to develop large-area photodetectors capable of time resolutions measured in pico-seconds, with acc…
Measuring roughness of buried interfaces by sputter depth profiling
S. V. Baryshev, J. A. Klug, A. V. Zinovev +3
In this communication, we report results of a high resolution sputter depth profiling analysis of a stack of 16 alternating MgO and ZnO nanolayers grown by atomic layer deposition…
High resolution SIMS depth profiling of nanolayers
S. V. Baryshev, A. V. Zinovev, C. E. Tripa +4
We report results of high-resolution TOF SIMS (time of flight secondary ion mass spectrometry) depth profiling experiments on a nanolayered structure, a stack of 16 alternating MgO…
White Light Interferometry for Quantitative Surface Characterization in Ion Sputtering Experiments
S. V. Baryshev, A. V. Zinovev, C. E. Tripa +2
White light interferometry (WLI) can be used to obtain surface morphology information on dimensional scale of millimeters with lateral resolution as good as ~1 μm and depth resolut…