collaborators

1 paper

eess.IV2025

A Fourier-Based Global Denoising Model for Smart Artifacts Removing of Microscopy Images

Huanhuan Zhao, Connor Vernachio, Laxmi Bhurtel +9

Microscopy such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) are essential tools in material imaging at micro- and n…