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cond-mat.mtrl-sci2004
Strain field of InAs QDs on GaAs (001) substrate surface: characterization by synchrotron X-ray Renninger scanning
S. L. Morelhão, L. H. Avanci, R. Freitas +1
Precise lattice parameter measurements in single crystals are achievable, in principle, by X-ray multiple diffraction (MD) experiments. Tiny sample misalignments can compromise sys…
cond-mat.mtrl-sci2004
On the high accuracy lattice-parameters determination by n-beam diffraction: Theory and application to the InAs quantum dots grown over GaAs(001) substrate system
L. H. Avanci, A. A. Quivy, S. L. Morelhao +1
Ultra-precise lattice parameter measurements in single crystals are achievable, in principle, by X-ray multiple diffraction (XMD) experiments. Tiny sample misalignments have hinder…