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cond-mat.mes-hall2004
Steps towards a capacitance standard based on single-electron counting at PTB
H. Scherer, S. V. Lotkhov, G. -D. Willenberg +1
A capacitance standard based on the definition of capacitance C = Ne/U is realized when a capacitor is charged with a known number N of electrons (e is the elementary charge) and t…
cond-mat.mes-hall2004
Single-charge devices with ultrasmall Nb/AlOx/Nb trilayer Josephson junctions
R. Dolata, H. Scherer, A. B. Zorin +1
Josephson junction transistors and 50-junction arrays with linear junction dimensions from 200 nm down to 70 nm were fabricated from standard Nb/AlOx/Nb trilayers. The fabrication…