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J. Hoefnagels

17 papers hereh-index 262.4k citations141 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • first author1
  • middle author10
  • last author6

Across the 17 of 17 papers where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci10
  • cond-mat.soft3
  • physics.app-ph2
  • physics.data-an1
  • physics.ins-det1
same name
  • J. Hoefnagels — 3 papers, h 7
  • J. Hoefnagels — 3 papers, h 4

Either other researchers who publish under this name, or the same person where the external sources have not merged their records.

identity via Semantic Scholar / OpenAlex

activity
20162024
most citedOne-step deposition of nano-to-micron-scalable, high-quality digital image correlation patterns for high-strain in-situ multi-microscopy testing

65 citations · 341 across the 17 of their papers we have counts for

collaborators
Showing 2018Show all

3 papers · 1 filter

physics.data-an2018★ 19 cited

On Micromechanical Parameter Identification With Integrated DIC and the Role of Accuracy in Kinematic Boundary Conditions

O. Rokoš, J. P. M. Hoefnagels, R. H. J. Peerlings +1

Integrated Digital Image Correlation (IDIC) is nowadays a well established full-field experimental procedure for reliable and accurate identification of material parameters. It is…

physics.app-ph2018★ 14 cited

A bulge test based methodology for characterizing ultra-thin buckled membranes

Salman Shafqat, Olaf van der Sluis, Marc Geers +1

Buckled membranes become ever more important with further miniaturization and development of ultra-thin film based systems. It is well established that the bulge test method, gener…

cond-mat.mtrl-sci2018★ 39 cited

Demonstrating the potential of Accurate Absolute Cross-grain Stress and Orientation correlation using Electron Backscatter Diffraction

Tijmen Vermeij, Marc De Graef, Johan Hoefnagels

We report a first exploration of High-angular-Resolution Electron Backscatter Diffraction, without using simulated Electron Backscatter Diffraction patterns as a reference, for abs…

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