Demonstrating the potential of Accurate Absolute Cross-grain Stress and Orientation correlation using Electron Backscatter Diffraction

Abstract

We report a first exploration of High-angular-Resolution Electron Backscatter Diffraction, without using simulated Electron Backscatter Diffraction patterns as a reference, for absolute stress and orientation measurements in polycrystalline materials. By co-correlating the pattern center and fully exploiting crystal symmetry and plane-stress, simultaneous correlation of all overlapping regions of interest in multiple direct-electron-detector, energy-filtered Electron Backscatter Diffraction patterns is achieved. The potential for highly accurate measurement of absolute stress, crystal orientation and pattern center is demonstrated on a virtual polycrystalline case-study, showing errors respectively below 20 MPa (or 1e-4 in strain), 7e-5 rad and 0.06 pixels.

arXiv commentManuscript as accepted for publication in Scripta Materialia

References in corpus (1)

• Structural phase transformations in metallic grain boundaries

Cited by in corpus (5)

• An iterative method for reference pattern selection in high resolution electron backscatter diffraction (HR-EBSD)
• Novel Remapping Approach for HR-EBSD based on Demons Registration
• Automated Reconstruction of Spherical Kikuchi Maps
• Electron Backscattered Diffraction using a New Monolithic Direct Detector: High Resolution and Fast Acquisition
• Pattern Matching Analysis of Electron Backscatter Diffraction Patterns for Pattern Centre, Crystal Orientation and Absolute Elastic Strain Determination: Accuracy and Precision Assessment