3 papers
physics.app-ph2025
Secondary electron topographical contrast formation in scanning transmission electron microscopy
Evgenii Vlasov, Wouter Heyvaert, Tom Stoops +3
Secondary electron (SE) imaging offers a powerful complementary capabilities to conventional scanning transmission electron microscopy (STEM) by providing surface-sensitive, pseudo…
physics.atom-ph2024
Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions
Zezhong Zhang, Ivan Lobato, Hamish Brown +5
The rich information of electron energy-loss spectroscopy (EELS) comes from the complex inelastic scattering process whereby fast electrons transfer energy and momentum to atoms, e…
cond-mat.mtrl-sci2024
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization
Daen Jannis, Wouter Van den Broek, Zezhong Zhang +2
By working out the Bethe sum rule, a boundary condition that takes the form of a linear equality is derived for the fine structure observed in ionization edges present in electron…