2 papers
physics.app-ph2025
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials
Hoelen L. Lalandec Robert, Max Leo Leidl, Knut Müller-Caspary +1
This publication presents an investigation of the performance of different analytical electron ptychography methods for low-dose imaging. In particular, benchmarking is performed f…
physics.optics2024
Retrieval of phase information from low-dose electron microscopy experiments: are we at the limit yet?
Francisco Vega Ibáñez, Jo Verbeeck
The challenge of imaging low-density objects in an electron microscope without causing beam damage is significant in modern TEM. This is especially true for life science imaging, w…