258 citations · 453 across the 6 of their papers we have counts for
1 paper · 2 filters
Georgios D. Barmparis, Yevgeniy S. Puzyrev, X. -G. Zhang +1
Inelastic scattering and carrier capture by defects in semiconductors are the primary causes of hot-electron-mediated degradation of power devices, which holds up their commercial…