603 citations · 1.5k across the 6 of their papers we have counts for
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physics.optics2016
Interference-aided spectrum fitting method for accurately film thickness determination
Xingxing Liu, Shao-Wei Wang, Hui Xia +4
A new approach was proposed to accurately determine the thickness of film, especially for ultra-thin film, through spectrum fitting with the assistance of interference layer. The d…
cond-mat.mtrl-sci2016★ 409 cited
Broadband Photovoltaic Detectors based on an Atomically Thin Heterostructure
Mingsheng Long, Erfu Liu, Peng Wang +19
Van der Waals junctions of two-dimensional materials with an atomically sharp interface open up unprecedented opportunities to design and study functional heterostructures. Semicon…