V. Dubkov

activity

20152024

most citedPt silicide/poly-Si Schottky diodes as temperature sensors for bolometers

13 citations · 40 across the 7 of their papers we have counts for

collaborators

Showing 2021Show all

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cond-mat.mtrl-sci2021

Influence of the thickness of Si and Ge films deposited on Si $_{3}$ N $_{4}$ /SiO $_{2}$ /Si substrates on their structure and diffusion of hydrogen atoms from Si $_{3}$ N $_{4}$ layers

Larisa V. Arapkina, Kirill V. Chizh, Dmitry B. Stavrovskii +5

The results of RHEED, FTIR and Raman spectroscopy study of silicon and germanium films with the thickness up to 200 nm grown from molecular beams on dielectric Si $_{3}$ N $_{4}$ /SiO $_{2}$ /…

Influence of the thickness of Si and Ge films deposited on Si3​N4​/SiO2​/Si substrates on their structure and diffusion of hydrogen atoms from Si3​N4​ layers

Influence of the thickness of Si and Ge films deposited on Si $_{3}$ N $_{4}$ /SiO $_{2}$ /Si substrates on their structure and diffusion of hydrogen atoms from Si $_{3}$ N $_{4}$ layers