97 citations · 268 across the 17 of their papers we have counts for
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cond-mat.str-el2024★ 1 cited
Imaging of electrically controlled van der Waals layer stacking in 1T-TaS2
Corinna Burri, Nelson Hua, Dario Ferreira Sanchez +16
Van der Waals (vdW) materials exhibit a variety of states that can be switched with low power at low temperatures, offering a viable cryogenic "flash memory" required for the class…
physics.optics2024★ 1 cited
Extreme ultraviolet lithography reaches 5 nm resolution
Iason Giannopoulos, Iacopo Mochi, Michaela Vockenhuber +2
Extreme ultraviolet (EUV) lithography is the leading lithography technique in CMOS mass production, moving towards the sub-10 nm half-pitch (HP) regime with the ongoing development…