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most citedSurface Relaxations, Current Enhancements, and Absolute Distances in High Resolution Scanning Tunneling Microscopy

172 citations · 640 across the 16 of their papers we have counts for

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Showing 2019 · cond-mat.mes-hallShow all

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cond-mat.mes-hall2019★ 11 cited

Optical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements

Yoichi Miyahara, Harrisonn Griffin, Antoine Roy-Gobeil +4

Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical re…