82 citations · 86 across the 3 of their papers we have counts for
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Xi Luo, Yaghoob Rahbarihagh, James C. M. Hwang +3
This letter evaluates temporal and thermal stability of a state-of-the-art few-layer phosphorene MOSFET with Al2O3 surface passivation and Ti/Au top gate. As fabricated, the phosph…