36 citations · 94 across the 10 of their papers we have counts for
3 papers · 1 filter
Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging
Frances Quigley, Patrick McBean, Peter O'Donovan +2
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher v…
Using Your Beam Efficiently: Reducing Electron-dose in the STEM via Flyback Compensation
Tiarnan Mullarkey, Jonathan J. P. Peters, Clive Downing +1
In the scanning transmission electron microscope, fast-scanning and frame-averaging are two widely used approaches for reducing electron-beam damage and increasing image signal-noi…
Unsupervised learning of ferroic variants from atomically resolved STEM images
Mani Valleti, Sergei V. Kalinin, Christopher T. Nelson +6
An approach for the analysis of atomically resolved scanning transmission electron microscopy data with multiple ferroic variants in the presence of imaging non-idealities and chem…