36 citations · 94 across the 10 of their papers we have counts for
10 papers
Predictive drift compensation of multi-frame STEM via live scan modification
Matthew Mosse, Jonathan J. P. Peters, Eoin Moynihan +4
Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or bea…
How Fast is Your Detector? The Effect of Temporal Response on Image Quality
Tiarnan Mullarkey, Matthew Geever, Jonathan J. P. Peters +3
With increasing interest in high-speed imaging should come an increased interest in the response times of our scanning transmission electron microscope (STEM) detectors. Previous w…
Interlacing in atomic resolution scanning transmission electron microscopy
Jonathan J. P Peters, Tiarnan Mullarkey, James A. Gott +2
Fast frame-rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in-situ events or reducing the appear…
Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging
Frances Quigley, Patrick McBean, Peter O'Donovan +2
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher v…
Using Your Beam Efficiently: Reducing Electron-dose in the STEM via Flyback Compensation
Tiarnan Mullarkey, Jonathan J. P. Peters, Clive Downing +1
In the scanning transmission electron microscope, fast-scanning and frame-averaging are two widely used approaches for reducing electron-beam damage and increasing image signal-noi…
Unsupervised learning of ferroic variants from atomically resolved STEM images
Mani Valleti, Sergei V. Kalinin, Christopher T. Nelson +6
An approach for the analysis of atomically resolved scanning transmission electron microscopy data with multiple ferroic variants in the presence of imaging non-idealities and chem…
Exit Wavefunction Reconstruction from Single Transmission Electron Micrographs with Deep Learning
Jeffrey M. Ede, Jonathan J. P. Peters, Jeremy Sloan +1
Half of wavefunction information is undetected by conventional transmission electron microscopy (CTEM) as only the intensity, and not the phase, of an image is recorded. Following…
Enhanced superconductivity in few-layer TaS due to healing by oxygenation
J. Bekaert, E. Khestanova, D. G. Hopkinson +15
When approaching the atomically thin limit, defects and disorder play an increasingly important role in the properties of two-dimensional materials. Superconductivity is generally…
Artefacts in geometric phase analysis of compound materials
Jonathan J. P. Petersa, Richard Beanland, Marin Alexe +4
The geometric phase analysis (GPA) algorithm is known as a robust and straightforward technique that can be used to measure lattice strains in high resolution transmission electron…
Lateral heterojunctions within monolayer semiconductors
Chunming Huang, Sanfeng Wu, Ana M. Sanchez +7
Heterojunctions between three-dimensional (3D) semiconductors with different bandgaps are the basis of modern light-emitting diodes, diode lasers, and high-speed transistors. Creat…