369 citations · 1.1k across the 23 of their papers we have counts for
23 papers
Quantification of Electron Energy-Loss Spectra
Pavel Potapov, Giulio Guzzinati
This manuscript summarizes the recent developments in EELS quantification flow as will be implemented in the CEOS Panta Rhei and TEMDM software. This should serve as a technical re…
Correction of STEM Distortions
Pavel Potapov, Giulio Guzzinati
The manuscript considers Scanning Transmission Electron Microscopy (STEM) images and derives transformations needed to correct various distortions occurring during scanning. These…
Wide field of view crystal orientation mapping of layered materials
A. Orekhov, D. Jannis, N. Gauquelin +10
Layered materials (LMs) are at the centre of an ever increasing research effort due to their potential use in a variety of applications. The presence of imperfections, such as bi-…
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale
Viveksharma Prabhakara, Daen Jannis, Giulio Guzzinati +3
Lattice strain measurement of nanoscale semiconductor devices is crucial for the semiconductor industry as strain substantially improves the electrical performance of transistors.…
Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping
Giulio Guzzinati, Wannes Ghielens, Christoph Mahr +4
Strain has a strong effect on the properties of materials and the performance of electronic devices. Their ever shrinking size translates into a constant demand for accurate and pr…
Spectral field mapping in plasmonic nanostructures with nanometer resolution
J. Krehl, G. Guzzinati, J. Schultz +7
Plasmonic nanostructures and devices are rapidly transforming light manipulation technology by allowing to modify and enhance optical fields on sub-wavelength scales. Advances in t…