Evidence of defect-induced ferromagnetism in ZnFe${}_2$O${}_4$ thin films

C. E. Rodríguez Torres, F. Golmar, M. Ziese +2

X-ray absorption near-edge and grazing incidence X-ray fluorescence spectroscopy are employed to investigate the electronic structure of ZnFe${}_2$O${}_4$ thin films. The spectrosc…