Evidence of defect-induced ferromagnetism in ZnFeO thin films
arXiv:1106.3128 · doi:10.1103/PhysRevB.84.064404
Abstract
X-ray absorption near-edge and grazing incidence X-ray fluorescence spectroscopy are employed to investigate the electronic structure of ZnFeO thin films. The spectroscopy techniques are used to determine the non-equilibrium cation site occupancy as a function of depth and oxygen pressure during deposition and its effects on the magnetic properties. It is found that low deposition pressures below 10 mbar cause iron superoccupation of tetrahedral sites without Zn inversion, resulting in an ordered magnetic phase with high room temperature magnetic moment.
Accepted for publication in Phys. Rev. B
Cited by in corpus (4)
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