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cond-mat.mtrl-sci2025
Large volume 'chunk' lift out for 3D tomographic analysis using analytical plasma focussed ion beam -- scanning electron microscopy
Ruth Birch, Shuheng Li, Sharang Sharang +2
Characterization of the structure and properties of materials in three dimensions, including grains and the residual pattern of deformation, provides necessary information required…
cond-mat.mtrl-sci2025
Practical considerations for crystallographic and microstructure mapping with direct electron detector-based electron backscatter diffraction
Tianbi Zhang, Ruth Birch, Graeme Francolini +2
Compact direct electron detectors are becoming increasingly popular in electron microscopy applications including electron backscatter diffraction, as they offer an opportunity for…