3 papers
cond-mat.mtrl-sci2025
Large volume 'chunk' lift out for 3D tomographic analysis using analytical plasma focussed ion beam -- scanning electron microscopy
Ruth Birch, Shuheng Li, Sharang Sharang +2
Characterization of the structure and properties of materials in three dimensions, including grains and the residual pattern of deformation, provides necessary information required…
physics.ins-det2025
Angular Resolution Enhancement of Electron Backscatter Diffraction Patterns
Ben Britton, Tianbi Zhang
We present a simple 'shift-and-add' based improvement in the angular resolution of single electron backscatter diffraction (EBSD) patterns. Sub-pixel image registration is used to…
cond-mat.mtrl-sci2025
Practical considerations for crystallographic and microstructure mapping with direct electron detector-based electron backscatter diffraction
Tianbi Zhang, Ruth Birch, Graeme Francolini +2
Compact direct electron detectors are becoming increasingly popular in electron microscopy applications including electron backscatter diffraction, as they offer an opportunity for…