92 citations · 363 across the 21 of their papers we have counts for
Showing 2003 · cond-mat.mtrl-sciShow all
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cond-mat.mtrl-sci2003★ 44 cited
STM characterization of the Si-P heterodimer
N. J. Curson, S. R. Schofield, M. Y. Simmons +3
We use scanning tunneling microscopy (STM) and Auger electron spectroscopy to study the behavior of adsorbed phosphine (PH) on Si(001), as a function of annealing temperature…
cond-mat.mtrl-sci2003
Atomically precise placement of single dopants in Si
S. R. Schofield, N. J. Curson, M. Y. Simmons +4
We demonstrate the controlled incorporation of P dopant atoms in Si (001) presenting a new path toward the creation of atomic-scale electronic devices. We present a detailed study…