Depth profile photoemission study of thermally diffused Mn/GaAs (001) interfaces

Y. Osafune, G. S. Song, J. I. Hwang +9

We have performed a depth profile study of thermally diffused Mn/GaAs (001) interfaces using photoemission spectroscopy combined with Ar${}^{+}$-ion sputtering. We found that Mn ion wa…