150 citations · 413 across the 6 of their papers we have counts for
5 papers
Combined electronic excitation and knock-on damage in monolayer MoS2
Carsten Speckmann, Julia Lang, Jacob Madsen +7
Electron irradiation-induced damage is often the limiting factor in imaging materials prone to ionization or electronic excitations due to inelastic electron scattering. Quantifyin…
Single-atom spectroscopy of phosphorus dopants implanted into graphene
Toma Susi, Trevor P. Hardcastle, Hans Hofsäss +7
One of the keys behind the success of the modern semiconductor technology has been the ion implantation of silicon, which allows its electronic properties to be tailored. For simil…
Isotope analysis in the transmission electron microscope
Toma Susi, Christoph Hofer, Giacomo Argentero +5
The Ångström-sized probe of the scanning transmission electron microscope can visualize and collect spectra from single atoms. This can unambiguously resolve the chemical structure…
Calculation of the graphene C 1 core level binding energy
Toma Susi, Duncan J. Mowbray, Mathias P. Ljungberg +1
X-ray photoelectron spectroscopy (XPS) combined with first principles modeling is a powerful tool for determining the chemical composition and electronic structure of novel materia…
Silicon-carbon bond inversions driven by 60 keV electrons in graphene
Toma Susi, Jani Kotakoski, Demie Kepaptsoglou +8
We demonstrate that 60 keV electron irradiation drives the diffusion of threefold coordinated Si dopants in graphene by one lattice site at a time. First principles simulations rev…