most citedCharge losses in segmented silicon sensors at the Si-SiO2 interface

39 citations · 39 across the 1 of their papers we have counts for

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physics.ins-det2012★ 39 cited

Charge losses in segmented silicon sensors at the Si-SiO2 interface

Thomas Poehlsen, Eckhart Fretwurst, Robert Klanner +3

Using multi-channel time-resolved current measurements (multi TCT), the charge collection of p+n silicon strip sensors for electron-hole pairs produced close to the Si-SiO2 interfa…