most citedNew Multi-Scale Simulation Framework for Next-Generation Electronic Design Automation with Application to the Junctionless Transistor

2 citations · 2 across the 3 of their papers we have counts for

collaborators
Showing eess.SPShow all

1 paper · 1 filter

eess.SP2022

A Space-Time Neural Network for Analysis of Stress Evolution under DC Current Stressing

Tianshu Hou, Ngai Wong, Quan Chen +2

The electromigration (EM)-induced reliability issues in very large scale integration (VLSI) circuits have attracted increased attention due to the continuous technology scaling. Tr…