2 citations · 2 across the 3 of their papers we have counts for
3 papers
cs.LG2022
Multilayer Perceptron Based Stress Evolution Analysis under DC Current Stressing for Multi-segment Wires
Tianshu Hou, Peining Zhen, Ngai Wong +4
Electromigration (EM) is one of the major concerns in the reliability analysis of very large scale integration (VLSI) systems due to the continuous technology scaling. Accurately p…
eess.SP2022
A Space-Time Neural Network for Analysis of Stress Evolution under DC Current Stressing
Tianshu Hou, Ngai Wong, Quan Chen +2
The electromigration (EM)-induced reliability issues in very large scale integration (VLSI) circuits have attracted increased attention due to the continuous technology scaling. Tr…
cond-mat.mes-hall2012★ 2 cited
New Multi-Scale Simulation Framework for Next-Generation Electronic Design Automation with Application to the Junctionless Transistor
J. Peng, Q. Chen, N. Wong +3
In this paper we present a new multi-scale simulation scheme for next-generation electronic design automation for nano-electronics. The scheme features a combination of the first-p…