5 citations · 7 across the 4 of their papers we have counts for
4 papers
Multilayer Perceptron Based Stress Evolution Analysis under DC Current Stressing for Multi-segment Wires
Tianshu Hou, Peining Zhen, Ngai Wong +4
Electromigration (EM) is one of the major concerns in the reliability analysis of very large scale integration (VLSI) systems due to the continuous technology scaling. Accurately p…
A Space-Time Neural Network for Analysis of Stress Evolution under DC Current Stressing
Tianshu Hou, Ngai Wong, Quan Chen +2
The electromigration (EM)-induced reliability issues in very large scale integration (VLSI) circuits have attracted increased attention due to the continuous technology scaling. Tr…
An Approximate Framework for Quantum Transport Calculation with Model Order Reduction
Quan Chen, Jun Li, Chiyung Yam +3
A new approximate computational framework is proposed for computing the non-equilibrium charge density in the context of the non-equilibrium Green's function (NEGF) method for quan…
New Multi-Scale Simulation Framework for Next-Generation Electronic Design Automation with Application to the Junctionless Transistor
J. Peng, Q. Chen, N. Wong +3
In this paper we present a new multi-scale simulation scheme for next-generation electronic design automation for nano-electronics. The scheme features a combination of the first-p…