most citedRobust formation of skyrmions and topological Hall effect in epitaxial thin films of MnSi

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cond-mat.mtrl-sci2012★ 347 cited

Robust formation of skyrmions and topological Hall effect in epitaxial thin films of MnSi

Yufan Li, N. Kanazawa, X. Z. Yu +6

Magneto-transport properties have been investigated for epitaxial thin films of B20-type MnSi grown on Si(111) substrates. Both Lorentz transmission electron microscopy (TEM) image…