activity
20102017
most citedGrain Boundary Resistance in Copper Interconnects from an Atomistic Model to a Neural Network

29 citations · 93 across the 8 of their papers we have counts for

collaborators

8 papers

cond-mat.mtrl-sci2017★ 29 cited

Grain Boundary Resistance in Copper Interconnects from an Atomistic Model to a Neural Network

Daniel Valencia, Evan Wilson, Zhengping Jiang +3

Orientation effects on the resistivity of copper grain boundaries are studied systematically with two different atomistic tight binding methods. A methodology is developed to model…

cond-mat.mes-hall2016★ 6 cited

Performance degradation of superlattice MOSFETs due to scattering in the contacts

Pengyu Long, Jun Huang, Zhengping Jiang +3

Ideal, completely coherent quantum transport calculations had predicted that superlattice MOSFETs may offer steep subthreshold swing performance below 60mV/dec to around 39mV/dec.…

cs.DC2015★ 3 cited

NEMO5: Achieving High-end Internode Communication for Performance Projection Beyond Moore's Law

Robert Andrawis, Jose David Bermeo, James Charles +12

Electronic performance predictions of modern nanotransistors require nonequilibrium Green's functions including incoherent scattering on phonons as well as inclusion of random allo…

cond-mat.mtrl-sci2015★ 10 cited

Surface Passivation in Empirical Tight Binding

Yu He, Yaohua Tan, Zhengping Jiang +3

Empirical Tight Binding (TB) methods are widely used in atomistic device simulations. Existing TB methods to passivate dangling bonds fall into two categories: 1) Method that expli…

cond-mat.mes-hall2014★ 12 cited

Anisotropic strain in SmSe and SmTe: implications for electronic transport

Marcelo A. Kuroda, Zhengping Jiang, Michael Povolotskyi +3

Mixed valence rare-earth samarium compounds SmX (X=Se,Te) have been recently proposed as candidate materials for use in high-speed, low-power digital switches driven by stress indu…

cond-mat.mtrl-sci2012

Empirical tight binding parameters for GaAs and MgO with explicit basis through DFT mapping

Yaohua Tan, Michael Povolotskyi, Tillmann Kubis +4

The Empirical Tight Binding(ETB) method is widely used in atomistic device simulations. The reliability of such simulations depends very strongly on the choice of basis sets and th…

cond-mat.mtrl-sci2011★ 19 cited

Effects of Interface Disorder on Valley Splitting in SiGe/Si/SiGe Quantum Wells

Zhengping Jiang, Neerav Kharche, Timothy Boykin +1

A sharp potential barrier at the Si/SiGe interface introduces valley splitting (VS), which lifts the 2-fold valley degeneracy in strained SiGe/Si/SiGe quantum wells (QWs). This wor…

physics.comp-ph2010★ 14 cited

Million Atom Electronic Structure and Device Calculations on Peta-Scale Computers

Sunhee Lee, Hoon Ryu, Zhengping Jiang +1

Semiconductor devices are scaled down to the level which constituent materials are no longer considered continuous. To account for atomistic randomness, surface effects and quantum…