activity
20122022
most citedKondo physics in antiferromagnetic Weyl semimetal Mn3+xSn1-x films

55 citations · 141 across the 6 of their papers we have counts for

collaborators

6 papers

cond-mat.mtrl-sci202221 cited

Perpendicular magnetic tunnel junctions with multi-interface free layer

Pravin Khanal, Bowei Zhou, Magda Andrade +8

Future generations of magnetic random access memory demand magnetic tunnel junctions that can provide simultaneously high magnetoresistance, strong retention, low switching energy…

cond-mat.mes-hall20217 cited

On the Temperature-dependent Characteristics of Perpendicular Shape Anisotropy-Spin Transfer Torque-Magnetic Random Access Memories (PSA-STT-MRAMs)

Wei Zhang, Zihan Tong, Yuzan Xiong +2

The perpendicular shape anisotropy-spin transfer torque-magnetic random access memories (PSASTT-MRAMs) takes advantage of the nanopillar free-layer geometry for securing a good the…

cond-mat.mtrl-sci202050 cited

Topological Hall Effect in a Topological Insulator Interfaced with a Magnetic Insulator

Peng Li, Jinjun Ding, Steven S. -L. Zhang +13

A topological insulator (TI) interfaced with a magnetic insulator (MI) may host an anomalous Hall effect (AHE), a quantum AHE, and a topological Hall effect (THE). Recent studies,…

cond-mat.mtrl-sci202055 cited

Kondo physics in antiferromagnetic Weyl semimetal Mn3+xSn1-x films

Durga Khadka, T. R. Thapaliya, Sebastian Hurtado Parra +9

Topology and strong electron correlations are crucial ingredients in emerging quantum materials, yet their intersection in experimental systems has been relatively limited to date.…

cond-mat.mes-hall20171 cited

Electrical control of metallic heavy-metal/ferromagnet interfacial states

Chong Bi, Congli Sun, Meng Xu +3

Voltage control effects provide an energy-efficient means of tailoring material properties, especially in highly integrated nanoscale devices. However, only insulating and semicond…

cond-mat.mtrl-sci20127 cited

Measurement of specific contact resistivity using scanning voltage probes

Weigang Wang, Malcolm R. Beasley

Specific contact resistivity measurements have conventionally been heavy in both fabrication and simulation/calculation in order to account for complicated geometries and other eff…