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20122020
most citedInP/InAsP Nanowire-based Spatially Separate Absorption and Multiplication Avalanche Photodetectors

31 citations · 52 across the 6 of their papers we have counts for

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cond-mat.mtrl-sci2012★ 5 cited

Application of photoreflectance to advanced multilayer structures for photovoltaics

D. Fuertes Marrón, E. Cánovas, I. Artacho +11

Photoreflectance (PR) is a convenient characterization tool able to reveal optoelectronic properties of semiconductor materials and structures. It is a simple non-destructive and c…