activity
20122020
most citedInP/InAsP Nanowire-based Spatially Separate Absorption and Multiplication Avalanche Photodetectors

31 citations · 52 across the 6 of their papers we have counts for

collaborators

6 papers

physics.app-ph20207 cited

Impact of the III-V/Ge nucleation routine on the performance of high efficiency multijunction solar cells

Laura Barrutia, Ivan García, Enrique Barrigon +3

This paper addresses the influence of III-V nucleation routines on Ge substrates for the growth of high efficiency multijunction solar cells. Three exemplary nucleation routines wi…

cond-mat.mes-hall2020

Hot-Carrier Separation in Heterostructure Nanowires observed by Electron-Beam Induced Current

Jonatan Fast, Enrique Barrigon, Mukesh Kumar +7

The separation of hot carriers in semiconductors is of interest for applications such as thermovoltaic photodetection and third-generation photovoltaics. Semiconductor nanowires of…

physics.app-ph20198 cited

Three-dimensional imaging of beam-induced biasing of InP/GaInP tunnel diodes

Cristina Cordoba, Xulu Zeng, Daniel Wolf +4

Electron Holographic Tomography was used to obtain 3-dimensional reconstructions of the morphology and electrostatic potential gradient of axial GaInP/InP nanowire tunnel diodes. C…

physics.app-ph20191 cited

Combined photo- and electroreflectance of multijunction solar cells enabled by subcell electric coupling

D. Fuertes Marrón, E. Barrigón, M. Ochoa +1

Electric coupling between subcells of a monolithically grown multijunction solar cell in short circuit allows their simultaneous and independent characterization by means of photo-…

physics.app-ph201731 cited

InP/InAsP Nanowire-based Spatially Separate Absorption and Multiplication Avalanche Photodetectors

Vishal Jain, Magnus Heurlin, Enrique Barrigon +11

Avalanche photodetectors (APDs) are key components in optical communication systems due to their increased photocurrent gain and short response time as compared to conventional pho…

cond-mat.mtrl-sci20125 cited

Application of photoreflectance to advanced multilayer structures for photovoltaics

D. Fuertes Marrón, E. Cánovas, I. Artacho +11

Photoreflectance (PR) is a convenient characterization tool able to reveal optoelectronic properties of semiconductor materials and structures. It is a simple non-destructive and c…