31 citations · 41 across the 2 of their papers we have counts for
1 paper · 1 filter
M. S. Khalil, M. J. A. Stoutimore, S. Gladchenko +10
Two-level system (TLS) defects in dielectrics are known to limit the performance of electronic devices. We study TLS using millikelvin microwave loss measurements of three atomic l…