activity
20032023
most citedRealizing the Hamiltonian in polariton simulators

340 citations · 2.5k across the 53 of their papers we have counts for

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Showing 2022Show all

6 papers · 1 filter

cond-mat.stat-mech2022

Differential Dynamic Microscopy can be applied to Differential Interference Contrast images despite shadowing effects

Timothy Ostler, Wolfgang Langbein, Paola Borri +5

During In Vitro Fertilisation (IVF), combining time-lapse contrast microscopy with suitable image processing techniques could facilitate non-invasive classification of oocyte healt…

physics.optics2022★ 1 cited

Correlative extinction and single fluorophore bleaching microscopy for ligand quantification on gold nanoparticles

Nicole Slesiona, Lukas Payne, Iestyn Pope +3

Nanoparticles (NPs) are promising therapeutic delivery agents, yet it is increasingly apparent that the number and manner of presentation of cell binding ligands on the NP can affe…

physics.optics2022★ 28 cited

Correlative light electron microscopy using small gold nanoparticles as single probes

Iestyn Pope, Hugh Tanner, Francesco Masia +6

Correlative light electron microscopy (CLEM) requires the availability of robust probes which are visible both in light and electron microscopy. Here we demonstrate a CLEM approach…

physics.app-ph2022★ 76 cited

Room-Temperature Quantum Emitter in Aluminum Nitride

Sam G. Bishop, John P. Hadden, Faris D. Alzahrani +4

A device that is able to produce single photons is a fundamental building block for a number of quantum technologies. Significant progress has been made in engineering quantum emis…

physics.optics2022★ 10 cited

First-order perturbation theory of eigenmodes for systems with interfaces

Zoltan Sztranyovszky, Wolfgang Langbein, Egor A. Muljarov

We present an exact first-order perturbation theory for the eigenmodes in systems with interfaces causing material discontinuities. We show that when interfaces deform, higher-orde…

cond-mat.mtrl-sci2022★ 4 cited

Low-energy electron microscopy intensity-voltage data -- factorization, sparse sampling, and classification

Francesco Masia, Wolfgang Langbein, Simon Fischer +2

Low-energy electron microscopy (LEEM) taken as intensity-voltage (I-V) curves provides hyperspectral images of surfaces, which can be used to identify the surface type, but are dif…