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20132021
most citedFirst-Principles Calculations of Luminescence Spectrum Line Shapes for Defects in Semiconductors: The Example of GaN and ZnO

274 citations · 274 across the 3 of their papers we have counts for

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cond-mat.mtrl-sci2018

Defect identification based on first-principles calculations for deep level transient spectroscopy

Darshana Wickramaratne, Cyrus E. Dreyer, Bartomeu Monserrat +4

Deep level transient spectroscopy (DLTS) is used extensively to study defects in semiconductors. We demonstrate that great care should be exercised in interpreting activation energ…