15 citations · 16 across the 5 of their papers we have counts for
5 papers
How high is a MoSe monolayer?
Rikke Plougmann, Megan Cowie, Yacine Benkirane +3
Transition metal dichalcogenides (TMDCs) have attracted significant attention for optoelectronic, photovoltaic and photoelectrochemical applications. The properties of TMDCs are hi…
Amplitude dependence of resonance frequency and its consequences for scanning probe microscopy
Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro +2
With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample intera…
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors
Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro +1
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sa…
Adsorption of PTCDA and C60 on KBr(001): electrostatic interaction versus electronic hybridization
Q. Jia, W. Ji, S. A. Burke +3
The adsorption of functional molecules on insulator surfaces is of great importance to molecular electronics. We present a systematical investigation of geometric and electronic pr…
Implementation of atomically defined Field Ion Microscopy tips in Scanning Probe Microscopy
William Paul, Yoichi Miyahara, Peter Grütter
The Field Ion Microscope (FIM) can be used to characterize the atomic configuration of the apex of sharp tips. These tips are well suited for Scanning Probe Microscopy (SPM) since…