7 citations · 7 across the 1 of their papers we have counts for
3 papers
Eliminating the effect of acoustic noise on cantilever spring constant calibration
Aaron Mascaro, Yoichi Miyahara, Omur E. Dagdeviren +1
A common use for atomic force microscopy is to quantify local forces through tip-sample interactions between the probe tip and a sample surface. The accuracy of these measurements…
Transient adhesion and conductance phenomena in initial nanoscale mechanical contacts between dissimilar metals
William Paul, David Oliver, Yoichi Miyahara +1
We report on transient adhesion and conductance phenomena associated with tip wetting in mechanical contacts produced by the indentation of a clean W(111) tip into a Au(111) surfac…
Damping of a nanomechanical oscillator strongly coupled to a quantum dot
Steven D. Bennett, Lynda Cockins, Yoichi Miyahara +2
We present theoretical and experimental results on the mechanical damping of an atomic force microscope cantilever strongly coupled to a self-assembled InAs quantum dot. When the c…